Automotive device test solution

IDDx Loadboard monitor

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The QD-10xx is a full featured, advanced configurable quiescent supply current (IDDQ) measurement instrument, supporting both probe and final test and designed for probe card and interface board applications. The instrument supports a wide range of IDDQ test and measurements applications and provides digital measurement values as well as a pass/fail output signal. On-board memory […]

Design solution

Pre-Silicon Test Pattern Validation, Debug, and Re-target Solution

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Solstice-PV helps design and test teams to work in the same environment, using waveforms as the universal communication language.Scan and functional patterns (ATPG, BIST, STIL, WGL, various ATE formats), including those from IP-core vendors, can be validated with the designer’s DUT model for advanced preparation of test patterns, and more importantly, to perform early detection […]

Cloud Testing Service solution

SerDes Test Solution

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Way more than meets the eye.Amazing performance. Engineered for maximum productivity.Everything you need to develop and verify your high-speed digital algorithms is contained in these ultra-portable test instruments. They will forever change the way you think about developing and verifying Gbps digital and mixed-signal algorithms, and they will allow you to measure signals in ways that […]

High speed digital measurement, SI/PI

Fixture for compliance test

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Wilder Technologies’ Test Adapter series is a dedicated fixture for high-speed serial interface standard compliance testing.Plug adapters / receptacle adapters / calibration cables and other kits provided in various combinations.Protect the connector to coaxial cable connection with its own housing. Ensure operability and durability.High speed transmission design based on 3D electromagnetic field simulation with signal […]

High speed digital measurement, SI/PI

DDRx memory measurement interposer

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NEXUS Technology’s component interposer is based on an oscilloscopeProvide the optimum physical probing point for observing the DDRx device signal.In consideration of trade-off between measurement easiness and signal integrity,The following three types based on the base are prepared.・Socket mount:    Both DUT and interposer body can be replaced with Grypper socket for replacement.・Direct type:    Both DUT […]

High speed digital measurement, SI/PI

IConnect® TDR/SParameter analysis tool

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IConnect is an interconnect signal integrity evaluation / modeling tool based on TDR / TDT measurement.TDR / TDT waveform management Multiple reflection removal by Z-Line algorithm / High precision characteristic impedance measurement  Single ended / differential S parameter measurementEye Diagram Analysis, Mask Test  Lossless transmission line parameter extraction / SPICE model generation  Mac model generation by […]