High speed digital measurement, SI/PIMemory device test solutionProductSolution

DDRx memory measurement interposer

DDRx memory measurement interposer

NEXUS Technology's component interposer is based on an oscilloscope
Provide the optimum physical probing point for observing the DDRx device signal.

In consideration of trade-off between measurement easiness and signal integrity,
The following three types based on the base are prepared.

・Socket mount:
    Both DUT and interposer body can be replaced with Grypper socket for replacement.
・Direct type:
    Both DUT and interposer body are fixed by solder mounting.
・Edge Probe:
    Same structure as direct type. Probe points are provided at the edge of the interposer substrate, allowing measurement in the immediate vicinity of the memory.

 *In addition, interposer corresponding to logic analyzer is also available.

[wpdm_button_template id=918 style="light" align="center"]

[wpdm_button_template id=920 style="light" align="center"]

DDR4

[wpdm_button_template id=923 style="light" align="center"]

[wpdm_button_template id=926 style="light" align="center"]

DDR3/DDR2

[wpdm_button_template id=928 style="light" align="center"]

[wpdm_button_template id=930 style="light" align="center"]

[wpdm_button_template id=932 style="light" align="center"]

GDDR5

[wpdm_button_template id=934 style="light" align="center"]

[wpdm_button_template id=936 style="light" align="center"]