Product

Interface for DC parametric test

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In recent years, with the increase in wafer diameter and process miniaturization, the number of devices to be measured and measurement time have increased, and the demand for lower price and higher measurement speed of parametric test system is increasing. In addition, with increasing measurement data, how to efficiently and easily process data analysis in […]

Product

Simple handler supporting WLCSP

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CharacteristicConditioning during design developmentProduct confirmation at quality assurance department (failure analysis etc.)Various soft modes (same position repeat measurement mode · refill mode)Compact size and space savingMain specificationsProductsWLCSP, BGA, QFN, QFP etc.utility単相AC100V、Max 10A, 50/60Hz DryAir 0.4MPa?0.7Mpa, 10NI/min780mm(W) x 800mm(D) x 500mm(H)Package sizeApplicable tray□1.6mm?□48mmEIAJ, JEDEC(135.8mm x 135.8mm) etc.Measurement environmentRoom temperature, high temperature (125 ° C) option * low […]

Product

Manual · Prober α 100/150/200

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Compatible with a wide range of needs for α series evaluation and analysis with comfortable operability popular Always adopting a soft contact by adopting a shock absorber. It adopts a large platen and realizes mounting of a margin manipulator. Moreover, it is possible to adjust Z of the needle at once by moving the platen […]