JF Microtechnology offers a range of test sockets for various lead / leadless packages that emphasize OEE (equipment overall efficiency) in IC / LSI production. It adopts its own contact pin and housing structure and covers a wide range from evaluation to mass production such as high current / Kelvin test and high frequency analog test.
Peripheral package IC test socket
![](http://www.ate.co.jp/en/wp-content/uploads/2017/01/uid000006_201510171846056eb7938e.png)