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Peripheral package IC test socket

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JF Microtechnology offers a range of test sockets for various lead / leadless packages that emphasize OEE (equipment overall efficiency) in IC / LSI production. It adopts its own contact pin and housing structure and covers a wide range from evaluation to mass production such as high current / Kelvin test and high frequency analog […]

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Litepoint The Leader in Wireless Test

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LitePoint’s innovative products for manufacturing were built for just that…the rigors and unique demands of testing complex wireless devices at high volumes in manufacturing. Delays cost time and time costs money. From rugged, battle-proven hardware, to software with easy-to-read results display and logging, LitePoint systems are designed from the ground up for high-volume production.IQxel Family(Test Solutions for Manufacturing) […]

LSI testing solution

Advanced Solutions for Testing Wireless Devices

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LitePoint’s innovative products for manufacturing were built for just that…the rigors and unique demands of testing complex wireless devices at high volumes in manufacturing. Delays cost time and time costs money. From rugged, battle-proven hardware, to software with easy-to-read results display and logging, LitePoint systems are designed from the ground up for high-volume production.

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MIPI DSI-2 Analysis on SV3C C-PHY Analyzer

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At-Speed Protocol Verification of Display Packet Transmissions Running on MIPI Physical LayersHighly sophisticated capture and analysis tools are embedded within the Introspect ESP Software and operated on the SV3C CPRX C-PHY Analyzer. The tools enable gaining insight into frame transmissions, DCS commands, and display panel configuration. Frame viewer provides a global view of DSI-2 captures […]

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Solstice-TDS Automatic EVCD to ATE Vector Translation: TimeTable

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While translating ATPG patterns (WGL and STIL formats) is a push-button operation using Solstice-TDS, converting Verilog simulation output (VCD and EVCD) to a tester format involves a process called cyclization. This process creates cycle-based timing from the event-based VCD/EVCD file. With Solstice TimeTable, signals, directions, test period, per-pin timing, and ATE format are all automatically […]

Automotive device test solution

IDDx Loadboard monitor

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The QD-10xx is a full featured, advanced configurable quiescent supply current (IDDQ) measurement instrument, supporting both probe and final test and designed for probe card and interface board applications. The instrument supports a wide range of IDDQ test and measurements applications and provides digital measurement values as well as a pass/fail output signal. On-board memory […]

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XStream SIF creation tool

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OverviewWe provide test program creation environment centering on SIF language adopted by Tester T66xx / T65xx series manufactured by ADVANTEST CORPORATION.You can read, modify and save existing SIF.Since the test program flow and the Pin state in each test can also be displayed in a list, it is convenient for data summarization, verification and reporting.By […]

LSI testing solution

Software development service for LSI test

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National Instruments’ NI LabVIEW is a graphical program development environment for measurement control systems. Using NI LabVIEW, we will develop application software that connects and controls multiple instruments with GPIB and performs semiconductor testing with low cost and short delivery time.CharacteristicParameter setting, graphic operation using selection, buttons, sliders, etc.GPIB control of multiple measuring instruments, measurement, […]

LSI testing solution

System LSI testing service

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 In recent years, a number of high-performance, multifunctional system LSIs have been developed by miniaturization of processes and development and automation of design tools. At the same time, a wide range of knowledge and high technical skill is required for test development and evaluation work of system LSI.  In addition, higher cost of corresponding test […]