LSI testing solution

yieldHUB Cloud Based Yield Management

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yieldHUB is a cloud-based yield management system used by fabless companies, IDMs, and OSATs around the world. yieldHUB offers a cost-effective solution by combining semiconductor test expertise and analytical technology with ever evolving cloud-based solutions. The data model is scalable from one Wafer to several lots and several MB to several TB. All you have […]

LSI testing solution

Advanced Solutions for Testing Wireless Devices

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LitePoint’s innovative products for manufacturing were built for just that…the rigors and unique demands of testing complex wireless devices at high volumes in manufacturing. Delays cost time and time costs money. From rugged, battle-proven hardware, to software with easy-to-read results display and logging, LitePoint systems are designed from the ground up for high-volume production.

Automotive device test solution

IDDx Loadboard monitor

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The QD-10xx is a full featured, advanced configurable quiescent supply current (IDDQ) measurement instrument, supporting both probe and final test and designed for probe card and interface board applications. The instrument supports a wide range of IDDQ test and measurements applications and provides digital measurement values as well as a pass/fail output signal. On-board memory […]

LSI testing solution

Software development service for LSI test

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National Instruments’ NI LabVIEW is a graphical program development environment for measurement control systems. Using NI LabVIEW, we will develop application software that connects and controls multiple instruments with GPIB and performs semiconductor testing with low cost and short delivery time.CharacteristicParameter setting, graphic operation using selection, buttons, sliders, etc.GPIB control of multiple measuring instruments, measurement, […]

LSI testing solution

System LSI testing service

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 In recent years, a number of high-performance, multifunctional system LSIs have been developed by miniaturization of processes and development and automation of design tools. At the same time, a wide range of knowledge and high technical skill is required for test development and evaluation work of system LSI.  In addition, higher cost of corresponding test […]

LSI testing solution

Desktop Semiconductor Test Data Analysis

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Examinator-Pro™ offers product and test engineers everything they need to characterize new ICs and test programs, quickly ramp up production at OSATs and identify and diagnose yield excursions. Examinator-Pro turns standard test data files like STDF, ATDF, PCM and 100+ other formats into comprehensive reports, and enables you to drill down into the data interactively […]

LSI testing solution

Design and test environment construction tool compatible with STIL

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STILDirectorIt is a tool to build a design / test environment (design kit) compatible with international standard test description language STILReduced test development TAT with STILIn the conventional test development, the description method of test data is different in each step of test design, design verification, test program creation, test, failure analysis, and the description […]

LSI testing solution

World Leading Enterprise Strength Vector Translation Platform Since 1979

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Largest Installed BaseSince 1979, Solstice-TDS has been used by generations of test engineers.  Solstice-TDS established many standard formats and methodoglies.  WGL was Solstice-TDS’s contribution to the industry, and has been used as the primary standard test interface language by ATPG tools before STIL.  Flow-based conversion methodology has been standardized in many top electronics firms.Supported EDA […]

Design solution

Pre-Silicon Test Pattern Validation, Debug, and Re-target Solution

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Solstice-PV helps design and test teams to work in the same environment, using waveforms as the universal communication language.Scan and functional patterns (ATPG, BIST, STIL, WGL, various ATE formats), including those from IP-core vendors, can be validated with the designer’s DUT model for advanced preparation of test patterns, and more importantly, to perform early detection […]